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IMB-CNM talks: Reliability testing methodology and lifetime modelling - Prof. Zoubir Khatir 
Tuesday, 16 October 2018, 12:00
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Reliability testing methodology and lifetime modelling

Prof. Zoubir Khatir

Institut Français des Sciences et Technologies des Transports, de l’Aménagement et des Réseaux | IFSTTAR · SATIE

Short abstract:

Lifetime reliability testing of power electronic devices by using power cycling tests is required to build up lifetime models. With them, the power devices remaining useful lifetime can be assesed to practice predictive maintenance. In this sense, recent experimental works carried out at IFSTTAR will be presented, such as reliability testing methodologies, aging strategies, methods for failure mechanisms separation, and cumulative degradation assessment. Some specific results on WBG devices (GaN HEMTs) will be described. Finally, modeling aspects will be discussed, like building lifetime models based on electro-thermo-mechanical stresses and material degradations.

Speaker Details & Scientific Scope: Prof. ZoubirKhatir (7th August, 1960) is a researcher at IFSTTAR, SATIE Laboratory (Versailles, France), leadering the TEMA (Technologies pour une Electro-MobilitéAvancée) research group. His current research interests include the reliability in high-temperature environments of silicon and wide band gap power devices in the field of transport applications.

Location IMB-CNM Sala de Actos "Pepe Millán"
Contact This email address is being protected from spambots. You need JavaScript enabled to view it.

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